Development of scanning electron microscopy and microanalysis with respect to LKAB processes

LKAB Contact Charlotte Andersson, Therese Lindberg    LTU Contact
Posted in Smart pellets

Scanning electron microscopy (SEM) is a technique widely used in fields such as geosciences, chemistry, materials sciences, metallurgy, medicin, electronics and the mechanical industry. It is ideal for high-resolution imaging of surfaces and elemental microanalysis of solids.

For further information about the technique, see for instance here.

This HLRC project aims to be advisory regarding scanning electron microscopy and microanalysis for other HLRC projects. If you think that your project could benefit from SEM work then please contact me for a discussion on the possibility to implement this technique in your research. We will also try to develop our in-house capacity on wavelength dispersive spectrometry (WDS) with respect to mineral processing applied to LKAB.

Lab equipment

Carl Zeiss Merlin High-Resolution FEG-SEM (image resolution of 0.8 nm), equipped with:

  • two different InLens-BSE detectors (backscatter electrons)
  • external SE detector (secondary electrons)
  • InLens SE detector (secondary electrons)
  • EDS detector (energy-dispersive spectrometry)
  • WDS detector (wavelength-dispersive spectrometry)
  • EBSD detector  (electron backscatter diffraction)

Carbon coater and plasma cleaner (for samples)

Additional equipment in nearby labs: FEI Magellan 400 XHR-SEM-EDS (0.5 nm), PANalytical Empyrean XRD (PIXcel3D detector).